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technospheramag
technospheramag
ТЕХНОСФЕРА_РИЦ
Competent opinion
Industrial nanotechnologies
D. Krasovitsky, A. Alekseev, S. Petrov, V.Chalyj
Standardized Manufacture of III-N Heterostructures for Solid-State Microwave Electronics Unique possibilities of the III group wide-band semiconductor nitrides for powerful transmitter-receivers of the microwave range, and ways of overcoming major problems, which arise during development of technology for instrument nitride heterostructures, have been considered. Creation of specialized growth equipment and application of innovative heterostructure designs and their growth modes allowed to achieve world-level results and expand prospects for improvement of such structures.
Standardized Manufacture of III-N Heterostructures for Solid-State Microwave Electronics Unique possibilities of the III group wide-band semiconductor nitrides for powerful transmitter-receivers of the microwave range, and ways of overcoming major problems, which arise during development of technology for instrument nitride heterostructures, have been considered. Creation of specialized growth equipment and application of innovative heterostructure designs and their growth modes allowed to achieve world-level results and expand prospects for improvement of such structures.
Test & Measurement
V. Ivanov, Yu. Tokunov
Measurement Support of Nanoindustry Production Companies Production Companies
Efficient measurement support to meet demand of companies working in the field of nanoindustry is a key condition for production of competitive and safe products and removal of obstacles in the way of entering international markets. Taking into account abovementioned tasks ROSNANO forms its own system of measurement support. In 2010 to fulfill service functions of this system a subsidiary company – ROSNANO Metrological Center integrating functions and competence of a company’s certification center was established.
Measurement Support of Nanoindustry Production Companies Production Companies
Efficient measurement support to meet demand of companies working in the field of nanoindustry is a key condition for production of competitive and safe products and removal of obstacles in the way of entering international markets. Taking into account abovementioned tasks ROSNANO forms its own system of measurement support. In 2010 to fulfill service functions of this system a subsidiary company – ROSNANO Metrological Center integrating functions and competence of a company’s certification center was established.
M. Veber
Confocal Microscopy of Micro- and Nanostructured Surfaces of Materials One of the key aspects of modern material science is receiving detailed information on a surface structure. Two-dimensional profilometry based on roughness parameters are not enough for industrial inspection, complex three-dimensional description of topography including nonstatic characteristics is required. In this connection confocal microscopy (CM) has serious advantages in view of contactless and quick receiving of such parameters. It is this method that provides description of determined and non-determined surface structures.
Confocal Microscopy of Micro- and Nanostructured Surfaces of Materials One of the key aspects of modern material science is receiving detailed information on a surface structure. Two-dimensional profilometry based on roughness parameters are not enough for industrial inspection, complex three-dimensional description of topography including nonstatic characteristics is required. In this connection confocal microscopy (CM) has serious advantages in view of contactless and quick receiving of such parameters. It is this method that provides description of determined and non-determined surface structures.
A.Useinov, K. Kravchuk, N. Lvova
Measurement of Wear Resistance of Super Thin Nanostructured Coatings Along with thickness, roughness, hardness and adhesion, wear resistance is one of the major mechanical characteristics of modern coatings. Reduction in thickness of coatings to units and dozens of nanometers significantly complicates the task of correct definition of their physicomechanical characteristics. A complex approach to research of thin films can give comprehensive information about their properties. The work proposes a method to measure wear resistance of protective coatings with the help of scanning nano hardness meter "NanoScan-3D".
Measurement of Wear Resistance of Super Thin Nanostructured Coatings Along with thickness, roughness, hardness and adhesion, wear resistance is one of the major mechanical characteristics of modern coatings. Reduction in thickness of coatings to units and dozens of nanometers significantly complicates the task of correct definition of their physicomechanical characteristics. A complex approach to research of thin films can give comprehensive information about their properties. The work proposes a method to measure wear resistance of protective coatings with the help of scanning nano hardness meter "NanoScan-3D".
Нанотехнологии и образование
I.Yaminsky, A.Erofeev, G.Kiselev, D.Kolesov, A.Protopopova
NanoTurner – that is Serious The article is devoted to machining of materials at the nanoscale. The nanorange is quite usual for modern machining centers. The Japanese concern Sodick, the leader in spark machining, has been producing a machine with subnanometer bars in feedback with a resolution of 0.07 nm since 2000. This machine, Sodick Ultra Nano 100, was designed for production of nano-optical devices: diffraction gratings, fiber optic plates, spherical and aspherical lenses. Using another machine, the milling center Sodick AZ150, one could achieve roughness of the surface of 11 nm. But the title of this article has one more meaning. It turned out that the number of working professionals (turners, millers, polishers and other machine operators) in Russia is at the nanoscale as compared with their number of the best years of the machining industry in the USSR. At the moment it appears that the turner is an extinct species, and here we have to consider a NanoTurner.
NanoTurner – that is Serious The article is devoted to machining of materials at the nanoscale. The nanorange is quite usual for modern machining centers. The Japanese concern Sodick, the leader in spark machining, has been producing a machine with subnanometer bars in feedback with a resolution of 0.07 nm since 2000. This machine, Sodick Ultra Nano 100, was designed for production of nano-optical devices: diffraction gratings, fiber optic plates, spherical and aspherical lenses. Using another machine, the milling center Sodick AZ150, one could achieve roughness of the surface of 11 nm. But the title of this article has one more meaning. It turned out that the number of working professionals (turners, millers, polishers and other machine operators) in Russia is at the nanoscale as compared with their number of the best years of the machining industry in the USSR. At the moment it appears that the turner is an extinct species, and here we have to consider a NanoTurner.
A.Ivanov, M.Kuznezova, V.Luchinin, A.Panin, V.Perepelovsky, V.Shklover
Remote Access to a Multifunctional Analytic and Technology Complex Development of network and communication technologies stimulates formation of remote access to expensive sophisticated equipment and unique methods of research. The article discusses experience of joint work of St.Petersburg State Electrotechnical University «LETI», coordinator of the educational work of National Nanotechnological Network (NNN), and the «Systems for microscopy and analysis» company, an official distributor in Russia of equipment of «FEI Co TOOLS FOR NANOTECH» company, to create a system for remote access to «Helios Nanolab» multifunctional analytical and technological complex (ATC) based on nanosized electron and ion beams.
Remote Access to a Multifunctional Analytic and Technology Complex Development of network and communication technologies stimulates formation of remote access to expensive sophisticated equipment and unique methods of research. The article discusses experience of joint work of St.Petersburg State Electrotechnical University «LETI», coordinator of the educational work of National Nanotechnological Network (NNN), and the «Systems for microscopy and analysis» company, an official distributor in Russia of equipment of «FEI Co TOOLS FOR NANOTECH» company, to create a system for remote access to «Helios Nanolab» multifunctional analytical and technological complex (ATC) based on nanosized electron and ion beams.
Tags: аналитико-технологический комплекс дистанционный доступ информационно-коммуникационные технологии многофункциональный наноразмерный электронный и ионный пучки
Conferences, Exhibitions, Seminars
История успеха
V.Bykov
International Recognition, Enthusiasm and Government Support International Recognition, Enthusiasm and Government Support
On June 23, 2011 American journal R&D declared results of R&D 100 Award competition. NANOEDUCATOR II microscope of NT-MDT company was included in the list of 100 best world scientific-engineering developments. It was the only Russian development among winners of 2011. (Among the winners there was an electric flashlight, fax, instant photo, plaster for giving up smoking, high-definition TV).
International Recognition, Enthusiasm and Government Support International Recognition, Enthusiasm and Government Support
On June 23, 2011 American journal R&D declared results of R&D 100 Award competition. NANOEDUCATOR II microscope of NT-MDT company was included in the list of 100 best world scientific-engineering developments. It was the only Russian development among winners of 2011. (Among the winners there was an electric flashlight, fax, instant photo, plaster for giving up smoking, high-definition TV).
Issues of patenting
D.Sokolov
Learning Inventions from the Nature A number of processes in the Nature can be interpreted in terms of invention acts. A methodology of drafting patent claims using this interpretation to facilitate revealing non-trivial inventing results from an existing design is proposed.
Learning Inventions from the Nature A number of processes in the Nature can be interpreted in terms of invention acts. A methodology of drafting patent claims using this interpretation to facilitate revealing non-trivial inventing results from an existing design is proposed.
Стандартизация
S. Hohlyavin
What Will Be the Standards for Nanoelectronics? The particle “nano” has become an indicator of a technology innovative character, though it only describes the measurement scale. Nanotechnology for eclectronics is mass production of instruments and integrated circuits with the elements minimal sizes from 100 to 1 nm, which allows for production of efficient devices with costs moderate. An overview of projects of standards developed by the third Working group of Technical committee IEC/TC113 and Institute of Electrical and Electronics Engineers (IEEE) is presented. The main objective of the international standardization is to transfer innovations in nanoelectronics from research laboratories to the information and telecommunication market
What Will Be the Standards for Nanoelectronics? The particle “nano” has become an indicator of a technology innovative character, though it only describes the measurement scale. Nanotechnology for eclectronics is mass production of instruments and integrated circuits with the elements minimal sizes from 100 to 1 nm, which allows for production of efficient devices with costs moderate. An overview of projects of standards developed by the third Working group of Technical committee IEC/TC113 and Institute of Electrical and Electronics Engineers (IEEE) is presented. The main objective of the international standardization is to transfer innovations in nanoelectronics from research laboratories to the information and telecommunication market