rus
TS_pub
technospheramag
technospheramag
ТЕХНОСФЕРА_РИЦ
Competent opinion
Nanotechnology
L.Kolesnik, S.Marinich, A.Seleznev
Inert gas assisted cluster deposition of copper With use of jet vapor deposition with the specially developed source of material, the copper coatings having a cluster structure are obtained.
Inert gas assisted cluster deposition of copper With use of jet vapor deposition with the specially developed source of material, the copper coatings having a cluster structure are obtained.
D.Andreev, O.Kovaleva, D.Koptsev
Microwave characteristics of transistors made of silicon-on-insulator with a channel length of 180 nm Characteristics obtained using a BSIMSOI4 SPICE model are comparing with results of experimental measurements of transistors manufactured by Mikron using CMOS silicon on insulator (SOI) 0.18 μm process.
Microwave characteristics of transistors made of silicon-on-insulator with a channel length of 180 nm Characteristics obtained using a BSIMSOI4 SPICE model are comparing with results of experimental measurements of transistors manufactured by Mikron using CMOS silicon on insulator (SOI) 0.18 μm process.
A.Benediktov, P.Ignatov
Modeling of full and partial depletion for high-temperature transistors on silicon-on-insulator structures The features of motion of major charge carriers in the space between the drain and source of SOI MOS transistors at different ambient temperatures are considered. The full and partial depletion of transistors is simulated.
Modeling of full and partial depletion for high-temperature transistors on silicon-on-insulator structures The features of motion of major charge carriers in the space between the drain and source of SOI MOS transistors at different ambient temperatures are considered. The full and partial depletion of transistors is simulated.
Tags: mos transistor soi кни моп-транзистор
Test & Measurement
K.Mochalov, A.Chistyakov, D.Solovyeva, A.Mezin, V.Oleinikov, I.Nabiev, I.Agapov, A.Efimov
Hardware combination of confocal microspectroscopy and 3D scanning probe nano-tomography Instrumental approach to combination of confocal microspectroscopy and the 3D scanning probe nano-tomography in a single device is developed.
Hardware combination of confocal microspectroscopy and 3D scanning probe nano-tomography Instrumental approach to combination of confocal microspectroscopy and the 3D scanning probe nano-tomography in a single device is developed.
Tags: optical microspectroscopy scanning probe microscopy; ultramicrotomy scanning probe nanotomography оптическая микроскопия сканирующая зондовая микроскопия сканирующая зондовая нанотомография ультрамикротомия
A.Useinov, K.Kravchuk, A.Rusakov, I.Maslenikov, I.Krasnogorov
Methods of automation of mechanical properties measurements in NanoScan nanohardness testers Tools for automation of mechanical properties measurements using NanoScan nanohardness tester are considered, including measurement generators, templates and specialized macro language.
Methods of automation of mechanical properties measurements in NanoScan nanohardness testers Tools for automation of mechanical properties measurements using NanoScan nanohardness tester are considered, including measurement generators, templates and specialized macro language.
Tags: automation instrumental indentation macro автоматизация инструментальное индентирование макрос
A.Ahmetova, G.Meshkov, I.Nazarov, O.Sinitsyna, I.Yaminsky
Detection of viruses and bacteria in scanning probe microscopy The prospects of use of flow-through liquid cell and a specialized biochip for fixation of biological objects are considered.
Detection of viruses and bacteria in scanning probe microscopy The prospects of use of flow-through liquid cell and a specialized biochip for fixation of biological objects are considered.
Tags: biochip flow-through liquid cell scanning probe microscope биочип проточная жидкостная ячейка сканирующий зондовый микроскоп
Military and space technology
E.Kuznetsov, A.Saurov
Hardware Trojans. Part 1: new th reats to cyber security Potential threats to cyber security caused by hardware Trojans are considered. The possible ways of their unauthorized insertion are examined. The comprehensive classification of hardware Trojans is presented.
Hardware Trojans. Part 1: new th reats to cyber security Potential threats to cyber security caused by hardware Trojans are considered. The possible ways of their unauthorized insertion are examined. The comprehensive classification of hardware Trojans is presented.
Tags: hardware backdoor hardware trojan integrated circuit malicious modification аппаратная закладка аппаратный троян интегральная схема несанкционированная модификация
N.Malashevich
RAM cell that is resistant to external factors The article shows the feasibility of single-port and dual-port blocks of random access memory (RAM) on gate arrays (GA) of 5521 and 5529 families, which has an increased resistance to external factors. RAM memory cell is considered.
RAM cell that is resistant to external factors The article shows the feasibility of single-port and dual-port blocks of random access memory (RAM) on gate arrays (GA) of 5521 and 5529 families, which has an increased resistance to external factors. RAM memory cell is considered.
Tags: gate array memory cell radiation hardness базовый кристалл радиационная стойкость ячейка памяти
V.Konyahin, R.Fedorov
Microchip for thyristor effect protection The paper describes the operation principles, structure and connection layout of the latch-up protection circuit designed for space-related equipment.
Microchip for thyristor effect protection The paper describes the operation principles, structure and connection layout of the latch-up protection circuit designed for space-related equipment.
Tags: protection microchip radiation resistance thyristor effect микросхема защиты радиационная стойкость тиристорный эффект
A.Lykyanov, R.Fedorov
Digital galvanic isolation circuit The paper describes the development of a dual-channel transformer galvanic isolation circuit on the basis of the unified cell library of 5521 gate array family, the main functional units and the principles of their operation.
Digital galvanic isolation circuit The paper describes the development of a dual-channel transformer galvanic isolation circuit on the basis of the unified cell library of 5521 gate array family, the main functional units and the principles of their operation.
А.Semenov, S.Belostotskaya
Creating one-time programmable elements for 5521 and 5529 gate array families The paper describes an example of fusible links (FL) design for 5521 and 5529 gate array families. The experimental data of the obtained samples of FL are presented.
Creating one-time programmable elements for 5521 and 5529 gate array families The paper describes an example of fusible links (FL) design for 5521 and 5529 gate array families. The experimental data of the obtained samples of FL are presented.
D.Mamonov
Control circuit for matrix alphanumeric LED-displays (7 × 5) The paper describes the design features of radiation-resistant circuit 5521TR034-726 for control of eight matrix alphanumeric displays (7 × 5) based on 5521 gate array family.
Control circuit for matrix alphanumeric LED-displays (7 × 5) The paper describes the design features of radiation-resistant circuit 5521TR034-726 for control of eight matrix alphanumeric displays (7 × 5) based on 5521 gate array family.
Education
Issues of patenting
D.Sokolov
Umbrella patent for invention The features of creation of umbrella patents is considered.
Umbrella patent for invention The features of creation of umbrella patents is considered.