rus
Competent opinion
V.Uzlov
"Deadman" or "team of tomorrow", it’s time to determine who you are in today’s market! With the new format of organization of production of electronic components, ADGEX offers fundamentally new opportunities from the small batch production of microcircuits to the turnkey delivery of technologies.
"Deadman" or "team of tomorrow", it’s time to determine who you are in today’s market! With the new format of organization of production of electronic components, ADGEX offers fundamentally new opportunities from the small batch production of microcircuits to the turnkey delivery of technologies.
P.Pavlov
Modular solutions for mechanical characterization of surface Anton Paar produces sensors, tools and systems for chemical analysis, measurement of mechanical properties, dimensional parameters, temperature, density, consistency, optical properties and other characteristics of materials and products, as well as sample preparation systems, equipment for chemical synthesis and other solutions.
Modular solutions for mechanical characterization of surface Anton Paar produces sensors, tools and systems for chemical analysis, measurement of mechanical properties, dimensional parameters, temperature, density, consistency, optical properties and other characteristics of materials and products, as well as sample preparation systems, equipment for chemical synthesis and other solutions.
J.Dolak
SVSC: modern technologies from Czech Republic The main business area of SVSC is the development and production of horizontal furnaces for the semiconductor industry and photovoltaics.
SVSC: modern technologies from Czech Republic The main business area of SVSC is the development and production of horizontal furnaces for the semiconductor industry and photovoltaics.
Nanotechnology
V.Odinokov
New vacuum-plasma processes and equipment for microelectronics Current vacuum-plasma processes for microelectronics including atomic-layer deposition, plasma-chemical etching, shallow trench isolation technique and wafer stripping are considered.
New vacuum-plasma processes and equipment for microelectronics Current vacuum-plasma processes for microelectronics including atomic-layer deposition, plasma-chemical etching, shallow trench isolation technique and wafer stripping are considered.
Tags: atomic layer deposition plasma-chemical etching shallow trench isolation wafer stripping атомно-слоевое осаждение мелкощелевая изоляция очистка пластин плазмохимическое травление
Nanomaterials
T.Nizina, A.Balykov, D.Korovkin, V.Volodin
Optimization of compositions of cement fiber fine-grained concretes containing carbon nanomodifiers Results of investigation of physical and mechanical characteristics of fiber fine-grained concretes containing carbon nanomodifiers are presented. The experimental studies allowed optimizing the formulations of modified fine-grained fiber concretes, which makes it possible to determine the rational compositions of cement composites in the margins of the main strength properties (the compressive strength and tensile strength in bending).
Optimization of compositions of cement fiber fine-grained concretes containing carbon nanomodifiers Results of investigation of physical and mechanical characteristics of fiber fine-grained concretes containing carbon nanomodifiers are presented. The experimental studies allowed optimizing the formulations of modified fine-grained fiber concretes, which makes it possible to determine the rational compositions of cement composites in the margins of the main strength properties (the compressive strength and tensile strength in bending).
Tags: compressive strength fiber fine-grained concrete tensile strength in bending мелкозернистый фибробетон предел прочности на растяжение при изгибе предел прочности при сжатии
Test & Measurement
A.Ahmetova, I.Yaminsky
Scanning capillary microscopy A review of publications on scanning ion conductance microscopy is presented to study the history of the development of this method, its features and applications.
Scanning capillary microscopy A review of publications on scanning ion conductance microscopy is presented to study the history of the development of this method, its features and applications.
Tags: scanning capillary microscopy scanning ion conductance microscope сканирующая капиллярная микроскопия сканирующий ион-проводящий микроскоп
G.Meshkov, O.Sinitsyna, Sh.Rajabzoda, A.Grigoryeva, I.Yaminsky
Scanning resistance microscopy of graphene oxides Using the scanning resistance microscopy, the local electrical conductivity of graphene oxides grown by the local anodic oxidation on the graphite surface and obtained by the chemical method was measured.
Scanning resistance microscopy of graphene oxides Using the scanning resistance microscopy, the local electrical conductivity of graphene oxides grown by the local anodic oxidation on the graphite surface and obtained by the chemical method was measured.
Tags: graphene oxide local anodic oxidation scanning resistance microscopy локальное анодное окисление оксид графена сканирующая резистивная микроскопия
A.Kurangyshev, N.Shilov, V.Kurangyshev
Measurement of thickness of polymer shell on surface of submicron filler particles for polymer composite materials A method has been developed and optimum parameters of the optical system for measuring the thickness of the polymer shell on the surface of submicron zinc oxide particles with a resolution of 20 nm have been determined.
Measurement of thickness of polymer shell on surface of submicron filler particles for polymer composite materials A method has been developed and optimum parameters of the optical system for measuring the thickness of the polymer shell on the surface of submicron zinc oxide particles with a resolution of 20 nm have been determined.
Tags: nephelometry polymer composite material two-layer particle двухслойная частица нефелометрия полимерный композиционный материал
S.Stepanov, S.Tarasov, A.Petrov, S.Stepanov
Investigation of error of UKM-1000 comparator for calibration of gauge blocks of length over 100 mm A study of the accuracy of the Russian UKM-1000 comparator for calibration of gauge blocks of length over 100 mm was made on the basis of the international method of calibration of gauge block comparators.
Investigation of error of UKM-1000 comparator for calibration of gauge blocks of length over 100 mm A study of the accuracy of the Russian UKM-1000 comparator for calibration of gauge blocks of length over 100 mm was made on the basis of the international method of calibration of gauge block comparators.
Conferences, Exhibitions, Seminars
D.Gudilin
Quantum technologies, basis for new technological revolution One of the significant events of the Open Innovations forum was a panel discussion "Applied quantum technologies. How is the world changing?" with the participation of leading Russian and world experts in the field of quantum technologies.
Quantum technologies, basis for new technological revolution One of the significant events of the Open Innovations forum was a panel discussion "Applied quantum technologies. How is the world changing?" with the participation of leading Russian and world experts in the field of quantum technologies.
14th Confocal Raman Imaging Symposium in Ulm
More than 100 scientists met in Ulm at the end of September for the 14th Confocal Raman Imaging Symposium.
Education
A.Ahmetova, I.Yaminsky
Nanotechnology YICC at Festival of Science Programming of games and algorithms in C + +, research of nanoparticles on a unique scanning probe microscope, creation of 3D models and printing on a 3D printer, manufacturing parts on a CNC milling and engraving machine are just some of the tasks that YICC participants are involved in.
Nanotechnology YICC at Festival of Science Programming of games and algorithms in C + +, research of nanoparticles on a unique scanning probe microscope, creation of 3D models and printing on a 3D printer, manufacturing parts on a CNC milling and engraving machine are just some of the tasks that YICC participants are involved in.
Reportage from laboratory
D.Georgiev
Implementation of Fab light model in practice IUHFSE RAS pays much attention to the development of the production infrastructure, in particular, the Fab light model is consistently implemented, which involves research, development, modeling, prototype production, and the production of small series of devices directly at the institute.
Implementation of Fab light model in practice IUHFSE RAS pays much attention to the development of the production infrastructure, in particular, the Fab light model is consistently implemented, which involves research, development, modeling, prototype production, and the production of small series of devices directly at the institute.