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DOI: https://doi.org/10.22184/1993-8578.2024.17.5.276.280
FemtoScan Online software, being a highly professional product for scientific research, has turned out to be a successful tool for educational activities in secondary and higher schools. In scientific research, FemtoScan Online provides the full range of necessary solutions for the collection, storage, analysis, processing and further application of experimental data from optical, electron and probe microscopy. The greatest value of the FemtoScan Online software lies in its wide capabilities for working with three-dimensional images from different perspectives, color scales using mathematical filters and operations, quantitative processing and clear visual representation. FemtoScan Online also provides the ability to work with two-dimensional data – diagrams, graphs, scans, etc. Photo processing can also be the focus of FemtoScan Online.
Tags: atomic force microscopy bionanoscopy data processing scanning probe microscopy substrate alignment атомно-силовая микроскопия бионаноскопия выравнивание подложки обработка данных сканирующая зондовая микроскопия
Subscribe to the journal Nanoindustry to read the full article.
FemtoScan Online software, being a highly professional product for scientific research, has turned out to be a successful tool for educational activities in secondary and higher schools. In scientific research, FemtoScan Online provides the full range of necessary solutions for the collection, storage, analysis, processing and further application of experimental data from optical, electron and probe microscopy. The greatest value of the FemtoScan Online software lies in its wide capabilities for working with three-dimensional images from different perspectives, color scales using mathematical filters and operations, quantitative processing and clear visual representation. FemtoScan Online also provides the ability to work with two-dimensional data – diagrams, graphs, scans, etc. Photo processing can also be the focus of FemtoScan Online.
Tags: atomic force microscopy bionanoscopy data processing scanning probe microscopy substrate alignment атомно-силовая микроскопия бионаноскопия выравнивание подложки обработка данных сканирующая зондовая микроскопия
Subscribe to the journal Nanoindustry to read the full article.
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