DOI: https://doi.org/10.22184/1993-8578.2024.17.7-8.464.475

The actively developing field of organic semiconductor electronics requires not only development of new conjugated donor-acceptor compounds, but also the creation of new methods of sample preparation at the stage of creating devices based on them. It is known that improving the mutual packing of molecules can significantly increase the efficiency of devices. In this paper, a cell was proposed that allows creating a thermal gradient in the process of structure formation, allowing the study of structures obtained at different annealing temperatures within a single experiment. Using the example of an organic compound with an irreversible phase transition, the processes occurring during such annealing were studied using atomic force microscopy, X-ray structural analysis with a sliding beam, and polarization optical microscopy.

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Суминов И.В.,Белкин П.Н., Эпельфельд А.В., Людин В.Б., Крит Б.Л., Борисов A.M.
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Issue #7-8/2024
A.A.Piryazev, I.E.Kuznetsov, A.A.Rychkov, A.F.Akhkiamova, A.Y.Konyakhina, M.A.Gorbunova, A.V.Akkuratov, D.A.Ivanov
DESIGN OF A CELL FOR STUDYING DOMAIN FORMATION PROCESSES IN CONJUGATED DONOR-ACCEPTOR SYSTEMS AT A GIVEN TEMPERATURE GRADIENT
DOI: https://doi.org/10.22184/1993-8578.2024.17.7-8.464.475

The actively developing field of organic semiconductor electronics requires not only development of new conjugated donor-acceptor compounds, but also the creation of new methods of sample preparation at the stage of creating devices based on them. It is known that improving the mutual packing of molecules can significantly increase the efficiency of devices. In this paper, a cell was proposed that allows creating a thermal gradient in the process of structure formation, allowing the study of structures obtained at different annealing temperatures within a single experiment. Using the example of an organic compound with an irreversible phase transition, the processes occurring during such annealing were studied using atomic force microscopy, X-ray structural analysis with a sliding beam, and polarization optical microscopy.

Tags:   atomic force microscopy   differential scanning calorimetry   organic electronics   x-ray diffraction analysis   атомно-силовая микроскопия   дифференциальная сканирующая калориметрия   органическая электроника   рентгеноструктурный анализ

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