Special Issue/2019
A. B. Boruzdina, A. A. Pechenkin, A. V. Yanenko, A. I. Chumakov, A. N. Egorov
Rational composition and features of practical application of test methods and installations for estimating microelectronic devices resistance to SEE
Rational composition and features of practical application of test methods and installations for estimating microelectronic devices resistance to SEE
It has been substantiated that a rational combination of reliability, informativeness and technical effectiveness of experimental evaluation of IC resistance to the SEE (heavy charged particles and high-energy cosmic protons, as well as single neutrons) is provided by a complex joint application of heavy ion cyclotrons, focused laser sources, protons accelerators and neutron generators, which do not compete, but complement each other.
It has been substantiated that a rational combination of reliability, informativeness and technical effectiveness of experimental evaluation of IC resistance to the SEE (heavy charged particles and high-energy cosmic protons, as well as single neutrons) is provided by a complex joint application of heavy ion cyclotrons, focused laser sources, protons accelerators and neutron generators, which do not compete, but complement each other.
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