rus
Special Issue/2019
M. G. Chistyakov, A. A. Glushko, S. А. Morozov, G. A. Yashin, S. V. Rumyantsev
Methods of determining on-chip variation coefficients for automated design of extra large digital integrated circuits
Methods of determining on-chip variation coefficients for automated design of extra large digital integrated circuits
The paper analyses changes in the time parameters of the basic elements for the technological process of the SOI with a minimum design size of 0.35 mm. A comparison of the results has been made with the aim of choosing the coefficient of technological reserve.
The paper analyses changes in the time parameters of the basic elements for the technological process of the SOI with a minimum design size of 0.35 mm. A comparison of the results has been made with the aim of choosing the coefficient of technological reserve.
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