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Special Issue/2019
O. S. Pivko, A. M. Galimov
Angular dependence and averaging over full solid angle of upset cross section in modern COTS memory circuits
Angular dependence and averaging over full solid angle of upset cross section in modern COTS memory circuits
The paper highlights angular dependence of the upset cross section in modern commercial memory circuits designed in the planar CMOS and FinFET technologies.
The paper highlights angular dependence of the upset cross section in modern commercial memory circuits designed in the planar CMOS and FinFET technologies.
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