rus
Special Issue/2019
A. M. Galimov, E. S. Shalashova, I. A. Fateev, A. V. Alexandrov
Exploring the susceptibility to dice fl ip-fl op upsets in CREME-MC
Exploring the susceptibility to dice fl ip-fl op upsets in CREME-MC
The dosimetric approach to cross section and error rate calculation of the DICE flip-flop is considered. The approach is based on the simultaneous deposited charge calculation in the sensitive volumes of the flip-flop by means of the CRÈME-MC Monte Carlo simulation tool.
The dosimetric approach to cross section and error rate calculation of the DICE flip-flop is considered. The approach is based on the simultaneous deposited charge calculation in the sensitive volumes of the flip-flop by means of the CRÈME-MC Monte Carlo simulation tool.
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