rus
Issue #5/2021
A.Yu.Nikiforov, M.S.Gorbunov, A.A.Smolin, D.V.Boychenko, G.G.Davydov
Evolution of radiation effects in sub-microelectronic devices and test facilities
Evolution of radiation effects in sub-microelectronic devices and test facilities
DOI: 10.22184/1993-8578.2021.14.5.298.310
We provide a brief evolution trends overview of the modern sub-microelectronic devices and its radiation behavior, focusing on new structures and materials. Evolution of test facilities is also considered.
We provide a brief evolution trends overview of the modern sub-microelectronic devices and its radiation behavior, focusing on new structures and materials. Evolution of test facilities is also considered.
Теги: magnetron sub-microelectronic devices radiation behavior radiation tests радиационное поведение радиационные испытания субмикроэлектронные устройства
Evolution of radiation effects in sub-microelectronic devices and test facilities
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